Not only detecting metal!

The new HEUFT ONE carries out a metal detection on a HEUFT level for the first time in a confined space. The latest release of the HEUFT eXaminer ^II XB provides even greater range and precision during the reliable identification of all types of foreign objects regardless of the packaging material.

It finds minute pieces of metal even when in full food packaging with metal components – and in addition product contamination comprising glass, stone, hard plastic or other high density materials. The unique combination of pulsed X-ray technology, innovative full-field image converters and real-time image processing capable of learning carries out a careful top-down inspection with a new dimension in precision, flexibility and range at maximum operational reliability. The continuous examination of particularly large size produts is achieved with a minimum amount of radiation without motion blurs. Thus all types of solid foreign objects as well as product incompleteness and packaging defects are detected reliably.

The high level of automation of the HEUFT SPECTRUM ^II device platform and the self-explanatory HEUFT NaVi user guidance make the error-free operation of the end of line system simply easy. Whether metal detection with the new entry-level device HEUFT ONE or more: HEUFT has the right solution for all applications!